Itapira, Brazil

Ricardo Breda Porcelli

This inventor holds 1 USPTO granted patent. Top assignee: Cnh Industrial America LLC. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ricardo Breda Porcelli. Retrieved from https://idiyas.com/inventor/ricardo-breda-porcelli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ricardo Breda Porcelli and Machine-Learned Crop Yield Estimation.

Introduction

Ricardo Breda Porcelli is an inventor based in Itapira, Brazil. His patent work concerns applying machine learning to estimate crop yields for agricultural harvesters.

Latest Patents

Porcelli is associated with 1 patent: “System and Method for Estimating Crop Yield for an Agricultural Harvester Using a Machine-Learned Model.” The invention describes a computing system that processes data about operating conditions of an agricultural harvester through a machine-learned model. The model produces a yield-related parameter that indicates the harvester’s crop yield. The system obtains the operating data, inputs it into the model, and receives the estimated parameter as output.

Career Highlights

Porcelli’s listed patent focuses on using machine learning to support crop-yield estimation in agricultural equipment. He is associated with CNH Industrial America LLC, a company working in the agricultural machinery sector.

Collaborations

Porcelli’s named coworkers include Daenio Cleodolphi and João Augusto Marcolin Lucca. Their names are associated with his professional and patent-related context.

Conclusion

Ricardo Breda Porcelli’s patent highlights the use of machine learning to estimate crop yields from agricultural harvester operating data, connecting digital modeling with agricultural equipment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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