This inventor holds 6 USPTO granted patents and 1 published patent application. Top assignee: Ideal Industries, Inc.. Active years: 2002-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2002-2004
Title: Rey P Harju: Innovator in Electronic Test Instruments
Introduction
Rey P Harju is a notable inventor based in Fullerton, CA (US), recognized for his contributions to the field of electronic test instruments. With a total of 6 patents to his name, Harju has made significant advancements in the functionality and usability of electronic measurement devices.
Latest Patents
One of Harju's latest inventions is an electronic test instrument with extended functions. This innovative clamp meter features a non-contact voltage sensing circuit that includes a blade and sensor integrated into the clamp. Additionally, the instrument is equipped with a shaker circuit that generates a tactile vibration in the presence of AC voltage, with the intensity of the vibration being proportional to the AC voltage level. Furthermore, a clean power indicator circuit is included, which compares the level of harmonic distortion plus noise to the full signal and activates an LED if the distortion plus noise is within acceptable limits.
Career Highlights
Harju is currently employed at Ideal Industries, Inc., where he continues to develop cutting-edge electronic measurement instruments. His work has significantly impacted the industry, enhancing the capabilities of test instruments used by professionals.
Collaborations
Throughout his career, Harju has collaborated with talented individuals such as James L Gregorec, Jr. and David Hines, contributing to the advancement of technology in electronic testing.
Conclusion
Rey P Harju's innovative spirit and dedication to improving electronic test instruments have established him as a key figure in the field. His patents reflect a commitment to enhancing functionality and user experience in electronic measurement devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile