This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Kistler Holding Ag. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: The Innovative Contributions of René Tanner
Introduction
René Tanner is a notable inventor based in Seuzach, Switzerland. He has made significant contributions to the field of sensor technology, particularly with his innovative sensor unit designed for measuring variables in aggressive mediums. His work exemplifies the intersection of engineering and practical application in modern technology.
Latest Patents
René Tanner holds a patent for a sensor unit that is specifically designed to measure a measurable variable in aggressive environments. This invention features a sensor housed within a casing, equipped with a measuring hole that allows direct access to the sensor zone. The design includes a measuring surface that contains measuring electronics, ensuring accurate readings while isolating the sensor from the medium. Additionally, the sensor is designed to disconnect from thermally or mechanically induced changes in the casing, enhancing its reliability and performance.
Career Highlights
Throughout his career, René Tanner has been associated with Kistler Holding AG, a company renowned for its advancements in measurement technology. His work has contributed to the development of innovative solutions that address complex measurement challenges in various industries.
Collaborations
René has collaborated with esteemed colleagues such as Jochen Von Berg and Christof Sonderegger. Their combined expertise has fostered an environment of innovation and creativity, leading to advancements in sensor technology.
Conclusion
René Tanner's contributions to sensor technology highlight his role as a key innovator in the field. His patent for a sensor unit demonstrates his commitment to developing solutions that meet the demands of aggressive environments. Through his work at Kistler Holding AG and collaborations with talented colleagues, Tanner continues to influence the landscape of measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
