Capuava, Brazil

Renan Ozelo Rodrigues De Mello

This inventor holds 1 USPTO granted patent. Top assignee: Pirelli Tyre S.p.a.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Renan Ozelo Rodrigues De Mello. Retrieved from https://idiyas.com/inventor/renan-ozelo-rodrigues-de-mello

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Renan Ozelo Rodrigues De Mello: Innovator in Tyre Monitoring Technology

Introduction

Renan Ozelo Rodrigues De Mello is a notable inventor based in Capuava, Brazil. He has made significant contributions to the field of tyre monitoring technology. His innovative approach has led to the development of a unique method for monitoring the status of tyres fitted on vehicles.

Latest Patents

Renan holds a patent for a "Method for monitoring a status of a tyre." This method involves a systematic approach to acquiring signals representative of the motion of a tyre's crown portion. The process includes obtaining frequency spectra, identifying peaks, and determining reference and current frequencies to monitor the tyre's status effectively.

Career Highlights

Renan is associated with Pirelli Tyre S.p.A., a leading company in the tyre manufacturing industry. His work focuses on enhancing vehicle safety and performance through innovative tyre monitoring solutions. With a patent to his name, he has established himself as a key player in the field.

Collaborations

Renan has collaborated with esteemed colleagues such as Andrea Natta and Massimiliano Sallusti. Their combined expertise contributes to the advancement of tyre technology and innovation.

Conclusion

Renan Ozelo Rodrigues De Mello is a pioneering inventor whose work in tyre monitoring technology is shaping the future of vehicle safety. His contributions are invaluable to the automotive industry and reflect his commitment to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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