Company Filing History:
Years Active: 2025
Title: Ren Odion: Innovator in Hyperspectral Imaging
Introduction
Ren Odion is a notable inventor based in Durham, NC (US). He has made significant contributions to the field of imaging technology, particularly through his innovative patent related to hyperspectral imaging systems. His work is instrumental in advancing the capabilities of imaging techniques used in various applications.
Latest Patents
Ren Odion holds a patent for "Spatially offset hyperspectral imaging systems and methods thereof." This patent describes a method for spatially locating a target inside a sample while providing spectral information for imaging the target. The process involves illuminating a light source onto a sample to produce a backscattered optical signal. It includes spectrally scanning and detecting the backscattered optical signal at selected spectral increments using a rapid wavelength-tuning solid-state device. The invention provides three-dimensional spectral information (x, y, wavelength) from the sample at a series of wavelengths of interest. Additionally, it spatially scans the backscattered signal in a two-dimensional plane at selected spatial increments, yielding three-dimensional spatial information (x, y, z) from the sample. Ultimately, the combination of three-dimensional spectral and spatial information produces a four-dimensional (x, y, z, and wavelength) data hypercube for collecting data from inside the sample.
Career Highlights
Ren Odion is affiliated with Duke University, where he continues to contribute to research and development in imaging technologies. His work at the university allows him to collaborate with other experts in the field, enhancing the impact of his innovations.
Collaborations
One of his notable collaborators is Tuan Vo-dinh, with whom he has worked on various projects related to hyperspectral imaging and its applications.
Conclusion
Ren Odion's contributions to hyperspectral imaging technology exemplify the innovative spirit of modern inventors. His patent and ongoing work at Duke University highlight the importance of advancements in imaging systems for scientific and practical applications.