The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jun. 22, 2023
Duke University, Durham, NC (US);
Tuan Vo-Dinh, Durham, NC (US);
Ren Odion, Durham, NC (US);
DUKE UNIVERSITY, Durham, NC (US);
Abstract
A method for spatially locating a target inside a sample and providing spectral information for imaging the target includes illuminating a light source onto a sample to produce a backscattered optical signal; spectrally scanning and detecting the backscattered optical signal at selected spectral increments using a rapid wavelength-tuning solid-state device; providing three-dimensional spectral information (x, y, wavelength) from the sample at a series of wavelengths of interest; spatially scanning the backscattered signal in a two-dimensional plane at selected spatial increments; providing three-dimensional spatial information (x, y, z) from the sample at a series of spatial dimensions of interest; and combining the three-dimensional spectral information and the three-dimensional spatial information to produce a four-dimensional (x, y, z, and wavelength) data hypercube for use in collecting data from inside the sample.