CA

Rémi Deroche

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Ametek, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rémi Deroche. Retrieved from https://idiyas.com/inventor/remi-deroche

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Rémi Deroche: Innovator in Sample Analysis Technology

Introduction

Rémi Deroche is a notable inventor based in California, recognized for his contributions to the field of sample analysis technology. He has developed innovative solutions that enhance the efficiency of moisture analysis processes.

Latest Patents

One of his significant inventions is the patent for a Vial Autoloader. This autoloader is designed for staging samples in vials, allowing them to be loaded automatically into analyzers, such as moisture analyzers. The device holds vials in a horizontal orientation, facilitating their delivery to and removal from the analyzer, which is essential for accurate moisture analysis.

Career Highlights

Rémi Deroche is currently employed at Ametek, Inc., where he continues to work on advancing technologies related to sample analysis. His expertise in this area has led to the development of practical solutions that benefit various industries.

Collaborations

Throughout his career, Rémi has collaborated with talented individuals, including Archibald Williams and Glen E Johnson. These partnerships have contributed to the successful development of innovative technologies.

Conclusion

Rémi Deroche's work in developing the Vial Autoloader exemplifies his commitment to innovation in sample analysis technology. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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