Jena, Germany

Reinhardt Willsch

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Bartec Componenete Und Systeme Gmbh, Institut Fuer Physikalische Hochtechnologie E.v.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Reinhardt Willsch. Retrieved from https://idiyas.com/inventor/reinhardt-willsch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Reinhardt Willsch: Innovator in Optical Sensor Technology

Introduction

Reinhardt Willsch is a notable inventor based in Jena, Germany. He has made significant contributions to the field of optical sensor technology. With a focus on innovation, Willsch has developed a patent that showcases his expertise and creativity.

Latest Patents

Willsch holds a patent for an optical sensor element. This invention highlights his ability to create advanced technological solutions that can be applied in various industries. His work in this area demonstrates a commitment to enhancing sensor technology.

Career Highlights

Throughout his career, Reinhardt Willsch has worked with several prominent companies. He has been associated with Bartec Komponenten und Systeme GmbH and the Institut für Physikalische Hochtechnologie e.V. These experiences have allowed him to refine his skills and contribute to significant projects in the field.

Collaborations

Willsch has collaborated with notable colleagues, including Gunter Schwotzer and Jürgen Bolle. These partnerships have enriched his work and fostered a collaborative environment for innovation.

Conclusion

Reinhardt Willsch is a distinguished inventor whose contributions to optical sensor technology are noteworthy. His patent and career achievements reflect his dedication to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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