Garching, Germany

Reinhard Schwarz

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Reinhard Schwarz. Retrieved from https://idiyas.com/inventor/reinhard-schwarz-1x995f4d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Reinhard Schwarz: Innovator in Microcrystalline Layer Manufacturing

Introduction

Reinhard Schwarz is a notable inventor based in Garching, Germany. He has made significant contributions to the field of material science, particularly in the manufacturing of microcrystalline layers. His innovative approach has led to advancements that are valuable in various applications.

Latest Patents

Reinhard holds a patent for a "Method of manufacturing microcrystalline layers and their utilization." This patent showcases his expertise and commitment to enhancing manufacturing processes in his field.

Career Highlights

Throughout his career, Reinhard has demonstrated a strong dedication to research and development. His work has not only contributed to his own professional growth but has also influenced the industry standards in microcrystalline technology.

Collaborations

Reinhard has collaborated with talented individuals such as Svetoslav Koynov and Thomas Fischer. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Reinhard Schwarz is a distinguished inventor whose work in microcrystalline layer manufacturing has made a lasting impact. His contributions continue to inspire advancements in material science and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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