Tokyo, Japan

Reiji Ohashi

This inventor holds 8 USPTO granted patents. Top assignees: Nippon Paper Industries Co., Ltd., Jujo Paper Co., Ltd.. Active years: 1991-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Reiji Ohashi. Retrieved from https://idiyas.com/inventor/reiji-ohashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.8

ph-index = 2

Forward Citations = 10(Granted Patents)


Location History:

  • Tokyo, JP (1991 - 1999)
  • Kita-ku, JP (2000 - 2003)

Company Filing History:


Years Active: 1991-2003

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8 patents (USPTO):Explore Patents

Title: Reiji Ohashi: Innovator in Thermally Sensitive Recording Media

Introduction

Reiji Ohashi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of thermally sensitive recording media. With a total of 8 patents to his name, Ohashi has established himself as a key figure in his area of expertise.

Latest Patents

One of his latest innovations includes a thermally sensitive recording medium. This invention showcases his commitment to advancing technology in recording materials. His work continues to influence the industry and improve the efficiency of recording processes.

Career Highlights

Throughout his career, Reiji Ohashi has worked with notable companies such as Nippon Paper Industries Co., Ltd. and Jujo Paper Co., Ltd. His experience in these organizations has allowed him to develop and refine his inventions, contributing to the growth of the industry.

Collaborations

Ohashi has collaborated with talented individuals, including Yukiko Ryu and Hidetoshi Yoshioka. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Reiji Ohashi's contributions to thermally sensitive recording media highlight his innovative spirit and dedication to advancing technology. His work continues to inspire future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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