Company Filing History:
Years Active: 1996-1998
Title: Reed Werlich: Innovator in Stereoscopic Imaging and Faraday Microscopy
Introduction
Reed Werlich is a notable inventor based in Jena, Germany. He has made significant contributions to the fields of stereoscopic imaging and microscopy. With a total of 2 patents, his work showcases innovative methods and arrangements that enhance visual technology.
Latest Patents
Werlich's latest patents include a method for generating a stereoscopic image and a Faraday microscope with a magneto-optical indicator as a terminating element. The stereoscopic image generation method involves illuminating an object with a beam, masking it to create component beams, and alternately directing these beams to the viewer's eyes. This technique allows for the creation of a three-dimensional perception of the object. The Faraday microscope patent focuses on examining specimens with stray magnetic fields, utilizing a magnetic indicator film to evaluate the influence of the specimen on the film, enhancing the capabilities of optical microscopy.
Career Highlights
Reed Werlich is associated with Carl Zeiss Jena GmbH, a leading company in optical systems and solutions. His work at this esteemed organization has allowed him to push the boundaries of imaging technology. His innovative approaches have contributed to advancements in both industrial and research applications.
Collaborations
Throughout his career, Werlich has collaborated with esteemed colleagues such as Karl-Heinz Geier and Hans Tandler. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.
Conclusion
Reed Werlich's contributions to the fields of stereoscopic imaging and microscopy exemplify the spirit of innovation. His patents reflect a commitment to enhancing visual technology, making significant strides in how we perceive and analyze the world around us.