The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 1996
Filed:
Jan. 25, 1995
Applicant:
Inventors:
Wilfried Andrae, Jena, DE;
Peter Goernert, Jena, DE;
Rudolf Hergt, Apolda, DE;
Jochen Taubert, Jena, DE;
Karl-Heinz Geier, Jena, DE;
Lothar Schreiber, Jena, DE;
Reed Werlich, Jena, DE;
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359368 ; 359484 ;
Abstract
In a Faraday microscope for examining specimens with stray magnetic fields in a reflected light beam path with a magnetic indicator film arranged in front of the specimen, the influence of the specimen on the indicator film is evaluated with the indicator film arranged as the termination of the microscope objective, the indicator film advantageously being arranged on an optically transparent substrate. The indicator film and substrate are taken into account in the optical calculation of the microscope objective.