This inventor holds 2 USPTO granted patents. Top assignee: Lockheed Missiles & Space Company, Inc.. Active years: 1996-1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996-1997
Title: Innovations by Rebecca L Welling
Introduction
Rebecca L Welling is an accomplished inventor based in La Honda, California. She has made significant contributions to the field of optical measurement systems. With a total of 2 patents, her work focuses on enhancing the accuracy and efficiency of three-dimensional object measurement.
Latest Patents
Rebecca's latest patents include a contour measurement system and a method for calibrating an optical system. The contour measurement system involves placing a three-dimensional object into the field of view of an optical system. The system is activated to gather data that provides a phase at each pixel corresponding to the object. The phases are then unwrapped using ordered phase unwrapping methods. This process converts the unwrapped phases into three-dimensional coordinates, which can be displayed on a computer. The calibration method shares several steps with the contour measurement system, including the mechanical measurement of a test calibration fixture. An optimization procedure is employed to minimize discrepancies between mechanically measured and calculated coordinates, ensuring the accuracy of the optical system.
Career Highlights
Rebecca is currently employed at Lockheed Missiles & Space Company, Inc., where she continues to innovate in the field of optical systems. Her work has been instrumental in advancing technologies that require precise measurements and calibrations.
Collaborations
Some of her notable coworkers include Edward D Huber and Rick A Williams, who have collaborated with her on various projects.
Conclusion
Rebecca L Welling's contributions to optical measurement systems demonstrate her expertise and commitment to innovation. Her patents reflect her dedication to improving measurement accuracy in three-dimensional applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
