New York, NY, United States of America

Rebecca Evans

This inventor holds 1 USPTO granted patent. Top assignee: Merck Sharp & Dohme LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rebecca Evans. Retrieved from https://idiyas.com/inventor/rebecca-evans-tatuzy67

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Rebecca Evans and a Method for Detecting Trace Nitrosamines.

Introduction

Rebecca Evans is an inventor associated with Merck Sharp & Dohme LLC in New York, New York. Her patent work includes a method designed to detect trace levels of semi-volatile nitrosamines in solid samples.

Latest Patents

The provided information lists 1 patent for Evans: “Method for Analyzing Trace Levels of Semi-Volatile Nitrosamines in Solid Samples.” The invention describes preparing a sample and adding chemicals that reduce or prevent nitrosamine formation during analysis. It then uses full evaporation static headspace gas chromatography coupled with a nitrogen-phosphorus detector (FE-SHSGC-NPD) to analyze the gaseous phase. The method is intended to provide rapid, sensitive detection of semi-volatile nitrosamines, including NDMA.

Career Highlights

Evans’s listed patent reflects work on analytical methods for detecting nitrosamine compounds in solid samples. The approach addresses the challenge of preventing nitrosamines from forming during sample preparation while enabling sensitive measurement.

Collaborations

The provided information names Xinxin Han and Daniel E. Lee as Evans’s coworkers. Their specific contributions to the patent are not stated.

Conclusion

Rebecca Evans’s listed invention combines sample preparation and gas chromatography-based analysis to support rapid, sensitive detection of trace semi-volatile nitrosamines.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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