Company Filing History:
Years Active: 2013-2021
Title: Innovations of Re-Long Chiu in Metal Ion Detection
Introduction
Re-Long Chiu is a notable inventor based in Vancouver, WA (US), recognized for his contributions to the field of semiconductor technology. He holds a total of 9 patents, showcasing his innovative approach to solving complex problems in metal ion detection.
Latest Patents
One of his latest patents is a solid-state sensor designed for metal ion detection and trapping in solution. This device provides a method for trapping metal ions and detecting contamination in a solution. It features a semiconductor device formed on a substrate, including an N-well over a P-type substrate, with a contact portion in electrical contact with the solution. When illuminated, a P/N junction is created due to photovoltaic phenomena, allowing metal ions to migrate to the contact area. The device includes a conductive structure with features separated by a gap, initially in an electrically open state. As ions migrate and precipitate, they bridge the gap, creating conductance that can be measured to determine the level of metal ion contamination.
Career Highlights
Re-Long Chiu has made significant strides in his career, particularly through his work at WaferTech, Inc. His innovative designs and patents have contributed to advancements in semiconductor technology and environmental monitoring.
Collaborations
He has collaborated with notable coworkers, including Shu-Lan Ying and Wen-Szu Chung, further enhancing the impact of his work in the field.
Conclusion
Re-Long Chiu's innovative contributions to metal ion detection through his patented technologies highlight his role as a leading inventor in semiconductor applications. His work continues to influence advancements in environmental monitoring and detection technologies.