Drancy, France

Razik Yousfi

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Razik Yousfi. Retrieved from https://idiyas.com/inventor/razik-yousfi-gfbchj8x

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Razik Yousfi

Introduction

Razik Yousfi is a notable inventor based in Drancy, France. He has made significant contributions to the field of image registration through his innovative patent. His work focuses on enhancing the efficiency and accuracy of image processing techniques.

Latest Patents

Razik Yousfi holds a patent titled "Multilevel thresholding for mutual information based registration and image registration using a GPU." This invention presents a method for registering images by determining an optimum intensity threshold set that maximizes variance between classes. The process involves segmenting images, generating mutual information from a joint histogram of the segmented images, and utilizing a geometry shader of a graphical processing unit for efficient computation.

Career Highlights

Yousfi is associated with Siemens Aktiengesellschaft, where he applies his expertise in image processing and technology development. His work at Siemens has allowed him to contribute to various projects that leverage advanced imaging techniques.

Collaborations

Some of his coworkers include Alban Lefebvre and Guillaume Bousquet, who collaborate with him on various projects within the company.

Conclusion

Razik Yousfi's innovative work in image registration and processing showcases his commitment to advancing technology in this field. His contributions are valuable to both his company and the broader scientific community.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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