Austin, TX, United States of America

Raymond S Lee


Average Co-Inventor Count = 1.8

ph-index = 4

Forward Citations = 66(Granted Patents)


Company Filing History:


Years Active: 2002-2005

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4 patents (USPTO):Explore Patents

Title: Innovations by Inventor Raymond S. Lee

Introduction

Raymond S. Lee is a notable inventor based in Austin, TX, who has made significant contributions to the field of image processing and defect detection. With a total of 4 patents to his name, Lee's work focuses on enhancing the clarity and reliability of digital images through innovative methods and systems.

Latest Patents

One of Lee's latest patents is titled "Method and system for multi-sensor signal detection." This invention provides a method and apparatus for defect detection using color-filter channels. It includes an electronic scanner equipped with a multilinear imager, a computer, and software that utilizes all color channels of the imager to collect infrared (IR) information. This technology aims to detect defects on physical media by improving IR gathering speed and image clarity. The invention captures IR light through each color-filter channel, effectively removing image defects such as dust and scratches. Another significant patent is "Method and system for altering defects in digital image." This method corrects digital images by calculating corrected intensity values for pixels in response to defect pixels, ensuring that the final image is reliable and accurate.

Career Highlights

Throughout his career, Raymond S. Lee has worked with prominent companies such as Eastman Kodak Company and Applied Science Fiction, Inc. His experience in these organizations has contributed to his expertise in image processing technologies and defect detection systems.

Collaborations

Lee has collaborated with notable individuals in his field, including Albert Durr Edgar and Gordon D. Ford. These collaborations have likely enriched his work and led to further advancements in his inventions.

Conclusion

Raymond S. Lee's innovative contributions to image processing and defect detection demonstrate his commitment to enhancing digital imaging technologies. His patents reflect a deep understanding of the challenges in this field and provide effective solutions for improving image quality.

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