The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Oct. 11, 2000
Gordon D. Ford, Round Rock, TX (US);
Thomas A. Dundon, Austin, TX (US);
Albert D. Edgar, Austin, TX (US);
Martin Potucek, Austin, TX (US);
Raymond S. Lee, Austin, TX (US);
Gordon D. Ford, Round Rock, TX (US);
Thomas A. Dundon, Austin, TX (US);
Albert D. Edgar, Austin, TX (US);
Martin Potucek, Austin, TX (US);
Raymond S. Lee, Austin, TX (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method and apparatus for defect detection through color-filter channels is provided. The present invention includes an electronic scanner or similar device having a multilinear imager, a computer, and software that implements all the color channels of the multilinear imager to collect IR information in order to detect defects on a physical medium. The present invention implements methods to increase IR gathering speed and/or increase the clarity of captured images on multilinear-imager devices. These improvements are accomplished by capturing infrared (IR) light through each color-filter channel such that image defects such as dust and scratches are removed. In one embodiment of the present invention, IR information is collected from each color channel at different scan positions in either a one-pass or a two-pass scanning system. In another embodiment of the present invention, each RGB color channel is used to collect both image and detect information at every scan line, again, either a one-pass or a two-pass scanning system.