Raymond Ohl

Title: Innovative Contributions of Raymond Ohl in Metrology

Introduction

Raymond Ohl, an accomplished inventor based in Dayton, MD, has made significant contributions to the field of metrology, particularly in the precise calibration of large-format detectors. With two patents to his name, Ohl has demonstrated his expertise and innovative spirit through his cutting-edge methods that enhance the accuracy and efficiency of data collection.

Latest Patents

Ohl's latest patents showcase his profound understanding of metrology and engineering principles.

1. **Method for the Absolute Calibration of the Location and Orientation of Large-Format Detectors Using Laser Radar**

This innovative method outlines a detailed process for mapping pixel locations within a detector array. It involves measuring the location on the detector, initiating a frame readout, and analyzing the frame to identify pixel locations in relation to metrology targets. This comprehensive approach allows for precise alignment of the detector array in space using subsequent measurements.

2. **Universal and Automated Monte Carlo Method Code for Uncertainty Propagation in Metrology Databases**

This patent introduces a systematic method for transforming target points during component integration into assemblies. By employing Monte Carlo transformations on common target points and evaluating their associated uncertainty values, this method ensures accurate integration and enhances the reliability of metrology databases.

Career Highlights

Raymond Ohl is associated with the United States of America as represented by the Administrator of NASA, where he applies his innovative solutions to advanced metrology challenges. His work has not only contributed to the operational efficiency of NASA but has also paved the way for advancements in various technological applications in engineering and space exploration.

Collaborations

Throughout his career, Ohl has worked alongside talented colleagues such as Phillip Coulter and Timothy Madison. These collaborations have fostered a creative environment for innovation, resulting in groundbreaking advancements in metrology and system integration.

Conclusion

Raymond Ohl's inventions reflect his dedication to precision and innovation in the field of metrology. His patents significantly contribute to improving calibration methods and data integration processes. As he continues his work with NASA, Ohl remains a prominent figure in advancing technology and enhancing the capabilities of large-format detectors.