Endicott, NY, United States of America

Raymond F Barnard

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Raymond F Barnard. Retrieved from https://idiyas.com/inventor/raymond-f-barnard

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 70(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: The Innovations of Raymond F. Barnard

Introduction

Raymond F. Barnard is a notable inventor based in Endicott, NY (US). He has made significant contributions to the field of failure mode and effects analysis (FMEA). His innovative approach has streamlined processes in various industries, particularly through his work at International Business Machines Corporation (IBM).

Latest Patents

Raymond F. Barnard holds a patent for a "System for failure mode and effects analysis." This system involves a team selected to perform FMEA in a meeting moderated by a trained facilitator. It utilizes a combination of group-ware, databases, bridge programs, and report generators to manage the analysis process. Members are prompted to enter failure modes for an apparatus or process into their workstations, with the information displayed anonymously. The system verifies the correctness of inputs through consensus, including automatic anonymous voting if necessary. A final list of failure modes is prepared and entered into the database, along with descriptions of their effects and quantities for relative severity, likelihood of occurrence, and likelihood of detection or mitigation. The system automatically calculates a risk prioritization number (RPN) and generates comprehensive FMEA reports.

Career Highlights

Throughout his career, Barnard has been instrumental in developing systems that enhance the efficiency and accuracy of FMEA processes. His work at IBM has positioned him as a leader in the field, contributing to advancements that benefit various sectors.

Collaborations

Raymond F. Barnard has collaborated with notable coworkers, including Stephen Leo Dohanich and Philip David Heinlein. Their combined expertise has furthered the development of innovative solutions in their respective fields.

Conclusion

Raymond F. Barnard's contributions to the field of failure mode and effects analysis exemplify the impact of innovation in technology. His patent and work at IBM highlight the importance of systematic approaches in managing risks and improving processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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