St. Charles, IL, United States of America

Raymond E DeGraw

This inventor holds 1 USPTO granted patent. Top assignee: Miner Enterprises, Inc.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Raymond E DeGraw. Retrieved from https://idiyas.com/inventor/raymond-e-degraw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Raymond E. DeGraw

Introduction

Raymond E. DeGraw is a notable inventor based in St. Charles, IL (US). He has made significant contributions to the field of measurement technology. With a focus on precision and utility, his work has garnered attention in the industry.

Latest Patents

Raymond E. DeGraw holds a patent for a measuring tool. This invention showcases his commitment to enhancing measurement accuracy and efficiency. His innovative approach has led to the development of tools that are essential in various applications.

Career Highlights

DeGraw is currently employed at Miner Enterprises, Inc. His role at the company allows him to apply his inventive skills in a practical setting. His experience and expertise contribute to the company's reputation for quality and innovation.

Collaborations

Throughout his career, DeGraw has worked alongside talented individuals such as Paul B. Aspengren and William P. O'Donnell. These collaborations have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Raymond E. DeGraw's contributions to the field of measurement tools exemplify his innovative spirit and dedication to improving technology. His work continues to influence the industry and inspire future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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