San Antonio, TX, United States of America

Raylon M Yow

This inventor holds 1 USPTO granted patent. Top assignee: The University of Texas System. Active years: 2004.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Raylon M Yow: Innovator in Wafer Cleaning Technology

Introduction

Raylon M Yow is an accomplished inventor based in San Antonio, TX. He has made significant contributions to the field of semiconductor manufacturing, particularly in the area of wafer cleaning technology. His innovative approach has the potential to enhance the efficiency and effectiveness of cleaning processes in the industry.

Latest Patents

Raylon holds a patent for an "Apparatus and method for cleaning a wafer." This invention provides a method that involves suspending a wafer beneath a vacuum chuck, which contains an acoustic wave emitter. The design ensures that the acoustic wave emitter does not contact the wafer's surface while applying acoustic waves to facilitate the cleaning process. This method represents a significant advancement in wafer cleaning technology.

Career Highlights

Raylon M Yow is affiliated with The University of Texas System, where he continues to engage in research and development. His work focuses on improving semiconductor manufacturing processes, contributing to advancements in technology that benefit various industries.

Collaborations

Raylon has collaborated with notable colleagues, including Dhiraj Sardar and Anthony Sayka. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Raylon M Yow is a notable inventor whose work in wafer cleaning technology exemplifies innovation in the semiconductor industry. His contributions are paving the way for more efficient manufacturing processes, showcasing the importance of research and development in advancing technology.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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