Austin, TX, United States of America

Rayfes Ahmed Mondal

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Pragma Design, Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rayfes Ahmed Mondal. Retrieved from https://idiyas.com/inventor/rayfes-ahmed-mondal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Rayfes Ahmed Mondal: Innovator in Transient Scanning Systems

Introduction

Rayfes Ahmed Mondal is a notable inventor based in Austin, Texas. He has made significant contributions to the field of transient scanning systems. His innovative work focuses on enhancing data visualization methods and systems.

Latest Patents

Rayfes holds a patent for "Embedded transient scanning systems, transient scanning data visualization systems, and/or related methods." This patent discloses exemplary embodiments of transient scanning data visualization methods and systems. It also includes innovative designs for embedded transient scanning systems and methods.

Career Highlights

Rayfes is currently employed at Pragma Design, Inc., where he applies his expertise in developing advanced scanning technologies. His work has positioned him as a key player in the field of data visualization.

Collaborations

Rayfes collaborates with various professionals in his field, including his coworker Jeffrey C. Dunnihoo. Their combined efforts contribute to the advancement of technology in transient scanning systems.

Conclusion

Rayfes Ahmed Mondal is a distinguished inventor whose work in transient scanning systems has the potential to revolutionize data visualization. His contributions are paving the way for future innovations in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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