Ray Haythornthwaite

Title: Ray Haythornthwaite: Innovator in Integrated Circuit Imaging

Introduction

Ray Haythornthwaite is a notable inventor based in Nepean, Canada. He has made significant contributions to the field of integrated circuit imaging, holding two patents that showcase his innovative approach to technology.

Latest Patents

Haythornthwaite's latest patents include an "Automatic Focused Ion Beam Imaging System and Method" and an "Automated Method of Circuit Analysis." The first patent presents a method for imaging an integrated circuit using a focused ion beam system. This method allows for plan-view imaging of the integrated circuit, enabling circuit information extraction without processing. It also describes a system that can automatically image an entire integrated circuit without removing it from the imaging system, requiring minimal operator intervention. The imaging and etching process is repeated until the entire integrated circuit is captured, resulting in a reliable three-dimensional topography. The second patent focuses on analyzing integrated circuits by scanning the upper layer with a beam and performing chemical analysis. This method correlates chemical and imaging information to reverse engineer the integrated circuit.

Career Highlights

Ray Haythornthwaite works at Chipworks Inc., where he continues to develop innovative solutions in the field of integrated circuits. His work has significantly advanced the understanding and analysis of integrated circuit technology.

Collaborations

Haythornthwaite has collaborated with notable coworkers, including Michael William Phaneuf and Dick James. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Ray Haythornthwaite's contributions to integrated circuit imaging and analysis demonstrate his commitment to innovation in technology. His patents reflect a deep understanding of the complexities involved in circuit design and analysis.