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For the Inventor, By the Inventor

Paulding, OH, United States of America

Ray A Stoller

This inventor holds 16 USPTO granted patents, primarily in Plasma Display Technology. Top assignees: Photonics Systems, Inc., Integrated Sensors, LLC, Other. Active years: 1996-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ray A Stoller. Retrieved from https://idiyas.com/inventor/ray-a-stoller

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 16

% Patents Active = 56.3

Average Co-Inventor Count = 1.4

ph-index = 8

Forward Citations = 186(Granted Patents)


Company Filing History:

goldMedal8 out of 12 
 
Photonics Systems, Inc.
 patents
silverMedal7 out of 22 
 
Integrated Sensors, LLC
 patents
bronzeMedal1 out of 834,601 
Other
 patents

Years Active: 1996-2016

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Areas of Expertise:
Plasma Panel
Ionizing Radiation Detector
Gray Scale Graphics
Display Device
Integrated Circuit Chips
Plasma Gas Discharge
Flat Panel Display
Video Display Drive
Dual Substrate
AC Plasma
Address Liquid Crystal Display
16 patents (USPTO):Explore Patents
1. 9261607 - Plasma panel based ionizing radiation detector (2016-02-16),
2. 8389946 - Plasma panel based ionizing radiation detector (2013-03-05),
3. 7982191 - Plasma panel based ionizing radiation detector (2011-07-19),
4. 7696485 - Plasma panel based ionizing radiation detector (2010-04-13),
5. 7564039 - Dual substrate plasma panel based ionizing radiation detector (2009-07-21),
6. 7518119 - Plasma panel based ionizing radiation detector (2009-04-14),
7. 7332726 - Plasma panel based ionizing radiation detector (2008-02-19),
8. 6765561 - Display device having integrated circuit chips thereon (2004-07-20),
9. 6222511 - AC plasma gas discharge gray scale graphics, including color, and video display drive system (2001-04-24),
10. 6184849 - AC plasma display gray scale drive system and method (2001-02-06),
11. 6075504 - Flat panel display screens and systems (2000-06-13),
12. 5995088 - Display device having intergrated circuit chips thereon (1999-11-30),
13. 5828356 - Plasma display gray scale drive system and method (1998-10-27),
14. 5754171 - Display device having integrated circuit chips thereon (1998-05-19),
15. 5742265 - AC plasma gas discharge gray scale graphic, including color and video (1998-04-21),

Title: Ray A Stoller: Innovator in Radiation Detection Technology

Introduction

Ray A Stoller is a notable inventor based in Paulding, Ohio, with a remarkable portfolio of 16 patents. His work primarily focuses on advancements in radiation detection technology, showcasing his innovative spirit and technical expertise.

Latest Patents

One of Stoller's latest inventions is the plasma panel-based ionizing radiation detector. This device is designed with a plasma panel that consists of a front substrate and a back substrate, creating a generally parallel gap. The X (column) and Y (row) electrodes are connected through gas discharge events, which define one or more pixels. Impedances are linked to the X and Y electrodes, while a power supply is connected to one or both types of electrodes. Additionally, discharge event detectors are integrated with the impedances to enhance functionality.

Career Highlights

Throughout his career, Ray A Stoller has made significant contributions to the field of radiation detection. He has worked with various companies, including Photonics Systems, Inc. and Integrated Sensors, LLC. His innovative designs and patents have played a crucial role in advancing technology in this area.

Collaborations

Stoller has collaborated with notable individuals in his field, including Peter S Friedman and Michael B Stalker. These partnerships have likely contributed to the development and refinement of his inventions.

Conclusion

Ray A Stoller stands out as a prominent inventor in the realm of radiation detection technology. His contributions through patents and collaborations reflect his dedication to innovation and advancement in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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