This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Qeexo, Co.. Active years: 2022-2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022-2025
Title: Innovations of Raviprakash Kandury
Introduction
Raviprakash Kandury is an accomplished inventor based in Cupertino, CA. He has made significant contributions to the field of automated machine vision, holding three patents that showcase his innovative approach to defect detection.
Latest Patents
One of his latest patents focuses on automated machine vision-based defect detection. This invention provides various mechanisms and processes for automatic computer vision-based defect detection using a neural network. The system is designed to receive historical datasets that include training images corresponding to known defects. Each training image is converted into a matrix representation for training the neural network, allowing it to adjust weighted parameters based on these known defects. Once the neural network is sufficiently trained, a test image of an object not included in the historical dataset is obtained. Portions of the test image are extracted as input patches for the neural network, which generates a probability score indicating the likelihood that each input patch includes a defect. An overall defect score for the test image is then produced based on these probability scores, indicating the condition of the object.
Career Highlights
Raviprakash Kandury is currently employed at Qeexo, Co., where he continues to develop innovative solutions in the realm of machine vision. His work has significantly advanced the capabilities of automated defect detection systems.
Collaborations
He collaborates with talented individuals such as Rajen Bhatt and Shitong Mao, contributing to a dynamic and innovative work environment.
Conclusion
Raviprakash Kandury's contributions to automated machine vision and defect detection exemplify the impact of innovation in technology. His patents reflect a commitment to advancing the field and improving industrial processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
