This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1990.
Company Filing History:
1 out of 834,411 Years Active: 1990
Title: The Innovative Contributions of Raul Y Tan
Introduction
Raul Y Tan is a notable inventor based in San Jose, California. He has made significant contributions to the field of optical engineering, particularly in the determination of film thickness and refractive index.
Latest Patents
Raul Y Tan holds a patent for a method titled "Method for film thickness and refractive index determination." This patent describes two methods for determining the thickness of a film of known material mounted on a solid substrate. The first method involves the inversion of an optical beam reflectivity equation, while the second method focuses on minimizing the variance of optical beam reflectivity across a predetermined sequence of wavelengths. Additionally, the patent outlines four methods for determining the real refractive index of a film of known thickness, utilizing techniques such as minimization of absolute differences in reflectivity and iterative techniques to converge on the final value of the refractive index.
Career Highlights
Throughout his career, Raul has demonstrated a strong commitment to innovation in optical technologies. His work has not only advanced the understanding of film properties but has also contributed to various applications in the industry.
Collaborations
Raul has collaborated with esteemed colleagues, including Robert G Ozarski and David W Myers. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise.
Conclusion
Raul Y Tan's contributions to the field of optical engineering are noteworthy, particularly his innovative methods for determining film thickness and refractive index. His work continues to influence advancements in the industry.