Langenargen, Germany

Raphael Bartsch

This inventor holds 1 USPTO granted patent. Top assignee: Testo Ag. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Raphael Bartsch. Retrieved from https://idiyas.com/inventor/raphael-bartsch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Raphael Bartsch - Innovator in 3D Representation Technology

Introduction

Raphael Bartsch is a notable inventor based in Langenargen, Germany. He has made significant contributions to the field of 3D representation technology. His innovative approach has led to the development of a unique method for creating 3D representations of recording objects.

Latest Patents

Raphael Bartsch holds a patent for a "Method for creating a 3D representation and corresponding image recording apparatus." This method involves identifying feature pixels in recorded individual images through computer-aided feature detection. It calculates 3D points and camera poses based on content correspondences. The process fits geometric primitives into the calculated 3D points and checks for discrepancies to output the most accurate geometric primitive.

Career Highlights

Raphael Bartsch is currently employed at Testo AG, where he continues to innovate in the field of imaging technology. His work has garnered attention for its practical applications in various industries.

Collaborations

He collaborates with talented coworkers, including Jan-Friso Evers-Senne and Philipp Sasse, who contribute to the advancement of their projects.

Conclusion

Raphael Bartsch's contributions to 3D representation technology exemplify the impact of innovative thinking in modern imaging solutions. His patent and ongoing work at Testo AG highlight his role as a key figure in this evolving field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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