Allen, TX, United States of America

Randy L Brown, Ii

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Randy L Brown, Ii. Retrieved from https://idiyas.com/inventor/randy-l-brown-ii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Innovations of Randy L Brown, II

Introduction

Randy L Brown, II is an accomplished inventor based in Allen, Texas. He has made significant contributions to the field of technology, particularly in the area of predicting burn-in conditions for devices. His innovative approach has led to the development of a unique patent that enhances the reliability of electronic devices.

Latest Patents

Randy holds a patent for a "System and method for predicting burn-in conditions." This invention involves a method that identifies baseline parameters such as IDDQ, temperature, and current density based on existing burn-in data. The process includes determining theoretical metrics and comparing them with actual measurements to establish optimal burn-in temperatures for devices.

Career Highlights

Randy is currently employed at Texas Instruments Incorporated, a leading company in the semiconductor industry. His work focuses on improving device performance and reliability through innovative methodologies. His dedication to research and development has positioned him as a valuable asset to his team.

Collaborations

Randy collaborates with George Ernest Harris, a fellow innovator at Texas Instruments. Together, they work on advancing technologies that contribute to the efficiency and effectiveness of electronic devices.

Conclusion

Randy L Brown, II exemplifies the spirit of innovation through his patent and contributions to the field of technology. His work not only enhances device reliability but also showcases the importance of collaboration in driving advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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