Carrollton, TX, United States of America

Randy Johnson

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Randy Johnson. Retrieved from https://idiyas.com/inventor/randy-johnson-mjwjlky2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 169(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Innovations by Randy Johnson

Randy Johnson is an accomplished inventor based in Carrollton, TX (US). He has made significant contributions to the field of integrated circuits through his innovative designs and patents.

Latest Patents

Randy Johnson holds a patent for a Non-destructive burn-in test socket for integrated circuit die. This invention serves as a temporary package for integrated circuit die, multichip hybrid, or a complete wafer. It is designed to conduct tests and burn-in processes without damaging the bonding pads or insulating passivation on the die. This innovation is crucial for ensuring the reliability and performance of integrated circuits.

Career Highlights

Randy Johnson is currently employed at Texas Instruments Corporation, a leading company in the semiconductor industry. His work at Texas Instruments has allowed him to develop and refine his inventions, contributing to advancements in technology.

Collaborations

Randy has collaborated with notable colleagues, including Richard A Elder and Dean L Frew. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Randy Johnson's contributions to the field of integrated circuits through his patent and work at Texas Instruments Corporation highlight his role as a significant inventor. His innovative solutions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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