Clinton, TN, United States of America

Randy J Parten

This inventor holds 2 USPTO granted patents. Top assignee: Ut-Battelle, Inc.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Randy J Parten. Retrieved from https://idiyas.com/inventor/randy-j-parten

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2023

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2 patents (USPTO):Explore Patents

Title: Innovations by Randy J Parten

Introduction

Randy J Parten is an accomplished inventor based in Clinton, TN (US). He has made significant contributions to the field of microfluidics, holding a total of 2 patents. His work focuses on developing innovative solutions that enhance the functionality and efficiency of microfluidic devices.

Latest Patents

Randy's latest patents include the "Microfluidic Glass Chip Interface Bracket" and the "Microfluidic Polymer Chip Interface Bracket." These inventions are designed to improve the integration and performance of microfluidic systems, showcasing his expertise in this cutting-edge technology.

Career Highlights

Randy is currently employed at UT-Battelle, Inc., where he continues to push the boundaries of innovation in his field. His role at the company allows him to collaborate with other talented professionals and contribute to groundbreaking research and development projects.

Collaborations

Throughout his career, Randy has worked alongside notable colleagues such as Jacob W McMurray and Kevin M Cooley. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of new technologies.

Conclusion

Randy J Parten is a notable inventor whose work in microfluidics has led to significant advancements in the field. His contributions, including his recent patents, reflect his commitment to innovation and excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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