Penfield, NY, United States of America

Randall K Hems


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Innovations by Randall K. Hems

Introduction

Randall K. Hems is an accomplished inventor based in Penfield, NY (US). He has made significant contributions to the field of optical scanning technology. His innovative approach has led to the development of a unique patent that addresses challenges in bandwidth-limited noise reduction.

Latest Patents

Randall K. Hems holds a patent for a "Method and apparatus for reducing bandwidth limited noise in an optical scanner." This optical scanning system features a laser pulser that outputs light at a predetermined duty cycle, which includes an on time and an off time. The system is equipped with a receiver that captures light at this duty cycle. Notably, the receiver contains an ambient light measuring and analyzing unit that evaluates the ambient light during the off time. This unit sends a signal to the laser pulser, providing information about the characteristics of the received ambient light. The laser pulser operates at a modulating frequency distinct from the frequency band of the received ambient light. This innovation enhances the performance of optical scanners in various applications.

Career Highlights

Randall K. Hems has dedicated his career to advancing optical scanning technologies. His work at Psc Scanning, Inc. has been pivotal in developing solutions that improve the efficiency and effectiveness of optical scanning systems. His patent reflects his commitment to innovation and problem-solving in the field.

Collaborations

Randall has collaborated with Robert William Rudeen, contributing to the development of advanced optical scanning technologies. Their partnership has fostered a creative environment that encourages innovation and the exploration of new ideas.

Conclusion

Randall K. Hems is a notable inventor whose work in optical scanning technology has led to significant advancements. His patent demonstrates his ability to address complex challenges in the field. His contributions continue to influence the development of more efficient optical scanning systems.

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