This inventor holds 2 USPTO granted patents. Top assignees: Lsi Corporation, Lsi Logic Corporation. Active years: 2005-2008.
Company Filing History:
Years Active: 2005-2008
Title: Ramon Gonzales: Innovator in Reliability Risk Identification
Introduction
Ramon Gonzales is a notable inventor based in Gresham, OR (US). He has made significant contributions to the field of reliability risk identification, holding 2 patents that showcase his innovative approach to technology.
Latest Patents
One of his latest patents is a method to selectively identify reliability risk die based on characteristics of local regions on the wafer. This method involves computing particle sensitive yield to identify reliability risk die. A bin characteristics database is maintained to identify hard and soft bins sensitive to different failure mechanisms. The process determines whether the particle sensitive yield of the local region around the current die is below a pre-set threshold. If it is, the die is downgraded; otherwise, it remains unchanged.
Career Highlights
Ramon has worked with prominent companies such as LSI Corporation and LSI Logic Corporation. His experience in these organizations has contributed to his expertise in the field of semiconductor technology and reliability assessment.
Collaborations
Some of his notable coworkers include Kevin Cota and Manu Rehani, who have collaborated with him on various projects throughout his career.
Conclusion
Ramon Gonzales is a distinguished inventor whose work in reliability risk identification has made a significant impact in the technology sector. His innovative methods and collaborations continue to influence advancements in semiconductor reliability.