Pasadena, CA, United States of America

Ramen P Singh

This inventor holds 1 USPTO granted patent. Top assignee: California Institute of Technology. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ramen P Singh. Retrieved from https://idiyas.com/inventor/ramen-p-singh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 51(Granted Patents)


Company Filing History:


Years Active: 2000

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ramen P Singh: Innovator in Optical Sensing Technologies

Introduction

Ramen P Singh is a notable inventor based in Pasadena, CA (US). He has made significant contributions to the field of optical sensing technologies. His innovative work has led to the development of a unique patent that addresses the measurement of surface curvature.

Latest Patents

Ramen P Singh holds a patent for a "Coherent gradient sensing method and system for measuring surface." This system and method are designed to determine the curvature of a specularly reflective surface based on optical interference. The technology utilizes two optical gratings to create a spatial displacement in an interference field, allowing for precise measurements of surface curvature.

Career Highlights

Ramen P Singh is affiliated with the California Institute of Technology, where he continues to advance research in optical technologies. His work has garnered attention for its innovative approach to solving complex measurement challenges.

Collaborations

Some of his notable coworkers include Ares J Rosakis and Elizabeth Kolawa. Their collaborative efforts contribute to the advancement of research in their respective fields.

Conclusion

Ramen P Singh's contributions to optical sensing technologies exemplify the impact of innovative thinking in scientific research. His patent reflects a significant advancement in the measurement of surface curvature, showcasing his role as a leading inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…