Cedar Park, TX, United States of America

Rama P Cherkur

This inventor holds 2 USPTO granted patents. Top assignee: Motorola Corporation. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rama P Cherkur. Retrieved from https://idiyas.com/inventor/rama-p-cherkur

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1998

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2 patents (USPTO):Explore Patents

Title: Innovations by Rama P Cherkur

Introduction

Rama P Cherkur is an accomplished inventor based in Cedar Park, TX (US). With a focus on innovative methods in technology, he has made significant contributions to the field through his patents. His work primarily revolves around non-destructive testing and surface cleanliness analysis.

Latest Patents

Rama P Cherkur holds 2 patents that showcase his inventive prowess. His latest patents include a non-destructive method of determining substrate tilt within a packaged component. This method involves using acoustic waves to measure distances between the component surface and regions on the substrate surface, allowing for precise tilt determination. Another notable patent is a method for determining the cleanliness of a surface of a substrate. This method utilizes a visual pattern and liquid droplet analysis to assess surface cleanliness, ensuring consistency and improving manufacturing throughput.

Career Highlights

Rama P Cherkur is currently employed at Motorola Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing product quality and manufacturing processes.

Collaborations

Rama has collaborated with notable coworkers, including Isaac T Poku and Yushi Matsuda, who contribute to the innovative environment at Motorola Corporation.

Conclusion

Rama P Cherkur's contributions to technology through his patents reflect his dedication to innovation and excellence. His work not only advances the field but also sets a standard for future developments in non-destructive testing and surface analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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