Butzbach, Germany

Ralf Krueger

This inventor holds 1 USPTO granted patent. Top assignee: Leica Microsystems Wetzlar Gmbh. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ralf Krueger. Retrieved from https://idiyas.com/inventor/ralf-krueger-vsz3t19d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Ralf Krueger: Innovator in Ray Bundle Technology

Introduction

Ralf Krueger is a notable inventor based in Butzbach, Germany. He has made significant contributions to the field of optical technology, particularly in the method of combining ray bundles. His innovative approach has implications for various applications in optics and imaging.

Latest Patents

Ralf Krueger holds a patent for a "Method and a device for the combination of a first and second beam of rays." This method involves forming a first partial beam and a second partial beam through the interaction of a first ray bundle with a beam-splitter layer. Additionally, it includes the formation of a third and fourth partial beam from a second ray bundle interacting with the same beam-splitter layer. The resulting outgoing ray bundle is created by superimposing these partial beams, ensuring that the reflections and transmissions of the beams are balanced.

Career Highlights

Ralf Krueger is associated with Leica Microsystems Wetzlar GmbH, a company renowned for its precision optics and imaging solutions. His work at Leica has allowed him to further develop his innovative ideas and contribute to advancements in optical technologies.

Collaborations

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Conclusion

Ralf Krueger's contributions to ray bundle technology exemplify the innovative spirit of modern inventors. His patent reflects a deep understanding of optical interactions, paving the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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