Mannheim, Germany

Ralf Huebner

This inventor holds 1 USPTO granted patent. Top assignee: Deere & Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ralf Huebner. Retrieved from https://idiyas.com/inventor/ralf-huebner-nzilx94l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ralf Huebner and Combine Harvester Sensing Technology.

Introduction

Ralf Huebner is an inventor associated with Mannheim, Germany, and Deere & Company. His patent work includes a sensor assembly designed to measure the height of crop mixture in a combine harvester’s cleaning system.

Latest Patents

Huebner is credited with 1 patent: “Sensory Assembly for Detecting the Height of a Mixture on a Conveyor Floor and/or Sieve of a Cleaning System of a Combine Harvester.” The invention uses at least two light-sensitive sensors positioned one above the other and a separate light emitter. As crop mixture blocks the emitted light, the sensors’ signals can be analyzed to produce an output representing the mixture’s height on the conveyor floor or sieve. This measurement can help monitor material flow through the harvester’s cleaning system.

Career Highlights

The available information connects Huebner’s invention to Deere & Company, a manufacturer of agricultural machinery. The patent addresses a practical challenge in combine harvester operation: detecting crop-material depth within the cleaning system.

Collaborations

The patent information identifies Deere & Company as the company associated with Huebner’s work. No additional collaborators are specified in the provided details.

Conclusion

Ralf Huebner’s patented sensor assembly applies light-based detection to measure crop mixture height, supporting the monitoring of material in a combine harvester’s cleaning system.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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