Aachen, Germany

Ralf Deininger


Average Co-Inventor Count = 6.5

ph-index = 3

Forward Citations = 151(Granted Patents)


Company Filing History:


Years Active: 2011-2016

Loading Chart...
6 patents (USPTO):Explore Patents

Title: Ralf Deininger: Innovator in Data Management Technologies

Introduction

Ralf Deininger is a prominent inventor based in Aachen, Germany. He has made significant contributions to the field of data management technologies, holding a total of 6 patents. His work focuses on creating innovative solutions that enhance the efficiency and accessibility of measurement data across enterprise systems.

Latest Patents

Ralf's latest patents include a method for interactively setting a search value in a data finder tool. This invention presents a TDM framework for managing self-describing measurement data. The framework provides applications with a central platform for accessing measurement data across an entire enterprise system. Individual plug-ins, specific to various data file formats, allow for unified indexing of meta-data for each data store. This unified indexing enables users to browse and query indexed measurement data without needing to open or read from the source data file. Another notable patent is a method for intelligent storing and retrieving in an enterprise data system, which shares similar features and benefits as his previous invention.

Career Highlights

Ralf Deininger is currently employed at National Instruments Corporation, where he continues to develop innovative solutions in data management. His expertise in creating frameworks for measurement data has positioned him as a key player in the industry.

Collaborations

Ralf has collaborated with several talented individuals, including Andreas Peter Haub and Stefan Romainczyk. Their combined efforts contribute to the advancement of technologies in their field.

Conclusion

Ralf Deininger is a notable inventor whose work in data management technologies has led to significant advancements in the industry. His innovative patents and contributions continue to shape the future of measurement data accessibility and efficiency.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…