The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Aug. 01, 2006
Andreas Peter Haub, Roetgen, DE;
Stefan Romainczyk, Aachen, DE;
Ralf Deininger, Aachen, DE;
Helmut Helpenstein, Erkelenz, DE;
Andreas Krantz, Zulpich, DE;
Myrle Krantz, Aachen, DE;
Andreas Peter Haub, Roetgen, DE;
Stefan Romainczyk, Aachen, DE;
Ralf Deininger, Aachen, DE;
Helmut Helpenstein, Erkelenz, DE;
Andreas Krantz, Zulpich, DE;
Myrle Krantz, Aachen, DE;
National Instruments Corporation, Austin, TX (US);
Abstract
A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which are specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.