Tampa, FL, United States of America

Rajesh Ganesan

This inventor holds 3 USPTO granted patents. Top assignee: University of South Florida. Active years: 2008-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rajesh Ganesan. Retrieved from https://idiyas.com/inventor/rajesh-ganesan-18b45c4v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 3.6

ph-index = 2

Forward Citations = 24(Granted Patents)


Location History:

  • Tampa, FL (US) (2008)
  • Centreville, VA (US) (2010)

Company Filing History:


Years Active: 2008-2010

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Innovations of Rajesh Ganesan

Introduction

Rajesh Ganesan is a notable inventor based in Tampa, FL, who has made significant contributions to the field of chemical mechanical planarization. With a total of 3 patents, his work focuses on enhancing control strategies and methodologies in complex processes.

Latest Patents

One of his latest patents is titled "System for multiresolution analysis assisted reinforcement learning approach to run-by-run control." This invention introduces a new multiresolution analysis (wavelet) assisted reinforcement learning (RL) based control strategy. It effectively addresses multiscale disturbances in processes and the absence of process models. The WRL-RbR controller, as it is termed, has been tested on a multiple-input-multiple-output (MIMO) Chemical Mechanical Planarization (CMP) process. Results indicate that this RL controller outperforms traditional EWMA based controllers, particularly in low autocorrelation scenarios. Additionally, the controller shows promising performance in strongly autocorrelated processes where EWMA controllers typically fail.

Another significant patent is "System and method for online end point detection for use in chemical mechanical planarization." This invention presents a robust and cost-effective online methodology for end point detection in CMP processes. It overcomes several limitations of existing detection approaches. The system identifies significant events in the CMP process by decomposing coefficient of friction data using wavelet-based multiresolution analysis and applying a sequential probability ratio test for variance on the decomposed data.

Career Highlights

Rajesh Ganesan is affiliated with the University of South Florida, where he continues to innovate and contribute to advancements in his field. His work is characterized by a commitment to improving process control and detection methodologies.

Collaborations

He has collaborated with notable colleagues, including Tapas K Das and Arun K Sikder, further enhancing the impact of his research and inventions.

Conclusion

Rajesh Ganesan's contributions to the field of chemical mechanical planarization through his innovative patents demonstrate his expertise and commitment to advancing technology. His work not only addresses current challenges but also paves the way for future developments in process control.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…