Bengaluru, India

Rajaah K Vasudevan

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rajaah K Vasudevan. Retrieved from https://idiyas.com/inventor/rajaah-k-vasudevan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations of Rajaah K Vasudevan

Introduction

Rajaah K Vasudevan is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of automated testing through his innovative ideas and patents. His work primarily focuses on enhancing the efficiency of test program generation.

Latest Patents

Rajaah holds a patent for a "Test program set generation tool." This invention automates the generation of a test specification and test program set for a given unit under test and a specific automated test equipment platform. The automation utilizes information stored in a repository, streamlining the testing process.

Career Highlights

Rajaah is currently employed at Honeywell International Inc., where he continues to develop innovative solutions in the field of automation and testing. His expertise and dedication have made him a valuable asset to the company.

Collaborations

Rajaah has collaborated with several talented individuals, including Ranga A Udipi and Rabindra Nath Raul. These collaborations have fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Rajaah K Vasudevan's contributions to automated testing through his patent and work at Honeywell International Inc. highlight his role as an influential inventor in the industry. His innovative spirit continues to drive advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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