Bengaluru, India

Raj Devesh

This inventor holds 1 USPTO granted patent. Top assignee: Fmr Corp.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Raj Devesh. Retrieved from https://idiyas.com/inventor/raj-devesh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Raj Devesh: Inventor of Methods for Measuring the Impact of Electronic Content

Introduction

Raj Devesh is an inventor based in Bengaluru, India. His patent work addresses ways to compare variations in electronic content and assess how changes may affect measured outcomes.

Latest Patents

Devesh is associated with 1 patent, titled “Systems, Methods, and Media for Comparing Variations of Electronic Content in Relation to a Measured Metric and/or Generating a Causal Model to Calculate the Effect of an Input Variable on a Desired Outcome.”

The invention describes methods for identifying whether a difference between versions of web-based content is a significant cause of a change in a measured metric. It evaluates factors including the probability of a false positive, statistical power, and the difference between distribution means. It also describes generating a causal model when no control group is available, allowing different interventions or variable values to be assessed for their impact on a desired outcome.

Career Highlights

Devesh is associated with FMR Corp. His patent reflects an interest in applying statistical analysis and causal modeling to evaluate electronic content and outcomes.

Collaborations

The provided information lists Ankit Ashok Baraskar and Manish Worlikar as Devesh’s coworkers. Their names appear alongside his professional associations, though specific collaborative roles in the patent are not stated.

Conclusion

Raj Devesh’s patent focuses on rigorous comparisons of electronic content and causal analysis, offering methods to evaluate which changes may meaningfully influence measured outcomes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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