Rainer Uhl

Title: Rainer Uhl and Accelerated Microscopy of Large Samples.

Introduction

Rainer Uhl is an inventor based in Munich, Germany, associated with Till L.D. GmbH. His patent work addresses a microscopy challenge: efficiently imaging samples that are larger than a microscope’s field of view.

Latest Patents

Uhl is credited with 1 patent, titled “Method for Accelerated Microscopy of Large Samples.” The method creates continuous relative movement between a sample and a microscope while keeping the microscope objective’s optical axis substantially perpendicular to the movement vector. It illuminates a narrow part of the sample through the objective, forming an illumination slit smaller than the field of view, and scans that slit across the field. During scanning, the sample moves either in the scanning direction or perpendicular to it, while the microscope objective collects light from the sample. This approach is designed to support image acquisition across samples too large to fit within a single field of view.

Career Highlights

Uhl’s listed invention focuses on coordinating sample movement, slit illumination, and image detection to enable microscopy of large samples. He is associated with Till L.D. GmbH.

Collaborations

The coworkers identified in the provided information are Christian Seebacher and Andreas Deeg.

Conclusion

Rainer Uhl’s patent describes a scanning-based microscopy method intended to accelerate imaging of large samples by coordinating illumination and movement.