Holzkirchen, Germany

Rainer Gaus

This inventor holds 2 USPTO granted patents. Top assignee: Industrieanlagen-Betriebsgesellschaft Mbh. Active years: 1997-1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rainer Gaus. Retrieved from https://idiyas.com/inventor/rainer-gaus-u4jrtige

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1997-1998

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2 patents (USPTO):Explore Patents

Title: Rainer Gaus: Innovator in High-Temperature Measurement Technologies

Introduction

Rainer Gaus is a notable inventor based in Holzkirchen, Germany. He has made significant contributions to the field of high-temperature measurement technologies. With a focus on precision and innovation, Gaus has developed solutions that enhance the accuracy of thermoelement calibration and extensometry.

Latest Patents

Rainer Gaus holds 2 patents that reflect his expertise and innovative spirit. His latest patents include a high-temperature thermoelement calibration device and a high-temperature extensometer. These inventions are crucial for industries that require reliable temperature measurements in extreme conditions.

Career Highlights

Gaus is currently employed at Industrieanlagen-Betriebsgesellschaft mbH, where he applies his knowledge and skills to advance the company's technological capabilities. His work has positioned him as a key player in the development of high-temperature measurement solutions.

Collaborations

Throughout his career, Rainer Gaus has collaborated with talented individuals such as Michael Dienz and Kai K Bar. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Rainer Gaus is a distinguished inventor whose work in high-temperature measurement technologies has made a significant impact in his field. His patents and collaborations highlight his commitment to advancing technology and improving measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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