This inventor holds 1 USPTO granted patent. Top assignee: Stevens Institute of Technology. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Rahmi Yazici: Innovator in X-Ray Analysis Technology
Introduction
Rahmi Yazici is a notable inventor based in Union City, NJ (US). He has made significant contributions to the field of particle size analysis through his innovative patent. His work focuses on enhancing the methods used in X-ray analysis, which is crucial for various scientific and industrial applications.
Latest Patents
Yazici holds a patent for a "Method and apparatus for x-ray analysis of particle size (XAPS)." This invention includes an apparatus that comprises an X-ray source, a monochromator, a goniometer, a position-sensitive detector, and a mechanism to rock or rotate the sample or the X-ray source. The computer means are utilized for interpreting the data obtained at the position-sensitive detector. The method involves generating an X-ray, narrowing the wavelength of the X-ray beam, allowing particles to diffract the beam, and detecting the diffracted beam with a position-sensitive detector. The process also includes collecting diffraction data from individual particles and compiling this data in computer memory to construct the intensity profile for the individual particles. Ultimately, the data is interpreted to determine particle size and particle size distribution.
Career Highlights
Rahmi Yazici is affiliated with the Stevens Institute of Technology, where he continues to contribute to research and development in his field. His work has implications for various industries that rely on precise particle size measurements.
Collaborations
Yazici collaborates with Dilhan M Kalyon, enhancing the research efforts at the Stevens Institute of Technology.
Conclusion
Rahmi Yazici's innovative approach to X-ray analysis has paved the way for advancements in particle size measurement technology. His contributions are vital for both academic research and practical applications in various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
