Esslingen, Germany

Rafael Küster

This inventor holds 1 USPTO granted patent. Top assignee: Robert Bosch. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rafael Küster. Retrieved from https://idiyas.com/inventor/rafael-küster

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Rafael Küster: Innovator in Paint Quality Testing

Introduction

Rafael Küster is a notable inventor based in Esslingen, Germany. He has made significant contributions to the field of paint and lacquer quality testing. His innovative approach has led to the development of a unique testing device that enhances the accuracy of quality assessments.

Latest Patents

Küster holds a patent for a "Testing device for checking the quality of a paint or lacquer layer." This device includes at least one friction element moving device designed to check the quality of paint or lacquer layers effectively. The device operates by initially moving a friction element in contact with the test region along a defined path, such as a circular path. Subsequently, it eliminates the frictional contact during the movement, preventing any impression on the test region.

Career Highlights

Rafael Küster is currently employed at Robert Bosch GmbH, where he continues to innovate and contribute to advancements in quality testing technologies. His work has been instrumental in improving the standards of paint and lacquer applications.

Collaborations

Küster collaborates with talented colleagues, including Olaf Eistert and Tobias Burk, who share his commitment to innovation and quality in their respective fields.

Conclusion

Rafael Küster's contributions to the field of paint quality testing exemplify his dedication to innovation. His patented device represents a significant advancement in ensuring the quality of paint and lacquer applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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