Hyderabad Telangana, India

Radhabai Bonigam

This inventor holds 1 USPTO granted patent. Top assignee: Dell Products Inc.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Radhabai Bonigam. Retrieved from https://idiyas.com/inventor/radhabai-bonigam

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Radhabai Bonigam: Innovator in Burn Process Data Retrieval

Introduction

Radhabai Bonigam is a notable inventor based in Hyderabad, Telangana, India. She has made significant contributions to the field of data retrieval and notification systems. Her innovative work focuses on enhancing the efficiency of burn processes in computing devices.

Latest Patents

Radhabai holds a patent for a method titled "Burn process data retrieval and notification." This patent outlines systems and processes for detecting ongoing burn processes in testing computing devices. It details how to retrieve burn data generated during these processes, thereby improving data management and notification systems.

Career Highlights

Radhabai is currently employed at Dell Products Inc., where she applies her expertise in technology and innovation. Her work at Dell has allowed her to contribute to advancements in computing and data retrieval systems.

Collaborations

Some of Radhabai's coworkers include Lokeswarareddy Tumuru and Durga Prasad Bikkina. Their collaboration fosters a creative environment that encourages innovation and the development of new technologies.

Conclusion

Radhabai Bonigam's contributions to burn process data retrieval highlight her role as a significant innovator in the tech industry. Her patent and work at Dell Products Inc. demonstrate her commitment to advancing technology and improving data management systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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