This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: Raba Mezenner: Innovator in Conductive Feature Technology
Introduction
Raba Mezenner is a notable inventor based in Richardson, TX (US). She has made significant contributions to the field of conductive feature technology, particularly through her innovative patent.
Latest Patents
Raba Mezenner holds a patent titled "Method for quantifying over-etch of a conductive feature." This invention provides a method for quantifying over-etch of a conductive feature. In one embodiment, this method includes forming a conductive feature over a substrate, with the conductive feature having a sheet resistance test structure associated therewith. The sheet resistance test structure has a first sheet resistance value. The method further includes etching the conductive feature and the sheet resistance test structure using a common etch process. After the etching, a second sheet resistance value of the sheet resistance test structure is obtained, allowing for the quantification of an amount of over-etch into the conductive feature using the first and second sheet resistance values. Raba has 1 patent to her name.
Career Highlights
Raba Mezenner is currently employed at Texas Instruments Corporation, where she continues to develop her expertise in conductive feature technology. Her work has been instrumental in advancing methods related to etching processes and conductive features.
Collaborations
Raba has collaborated with notable coworkers, including Kiyomi Hirose and Satoshi Suzuki, contributing to a dynamic and innovative work environment.
Conclusion
Raba Mezenner's contributions to the field of conductive feature technology through her patent demonstrate her innovative spirit and dedication to advancing technology. Her work at Texas Instruments Corporation continues to impact the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
