Kettering, OH, United States of America

Quinn Leland

This inventor holds 1 USPTO granted patent. Top assignee: Ysi, Inc.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Quinn Leland. Retrieved from https://idiyas.com/inventor/quinn-leland

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 446(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Quinn Leland: Innovator in Biosensor Technology

Introduction

Quinn Leland is an accomplished inventor based in Kettering, OH (US). He has made significant contributions to the field of biosensor technology, particularly with his innovative designs that enhance sensor performance.

Latest Patents

Leland holds a patent for a Microstructured Bilateral Sensor. This bilateral biosensor is based on a microporous architecture that aims to reduce the limitations posed by co-reactant concentration. By utilizing a new sensor microgeometry, the design significantly augments the concentration of oxygen and other co-reactants in the sensor's reaction zone. This advancement allows for improved performance over traditional microscale devices that employ unilateral orientation.

Career Highlights

Quinn Leland is currently employed at YSI, Inc., where he continues to develop cutting-edge technologies in biosensing. His work focuses on creating devices that can operate more efficiently and effectively in various applications.

Collaborations

Leland collaborates with notable colleagues, including Donald R. Moles and Marcel Madaras, who contribute to the innovative environment at YSI, Inc.

Conclusion

Quinn Leland's contributions to biosensor technology exemplify the impact of innovative thinking in the field of science and engineering. His work continues to pave the way for advancements that enhance sensor capabilities and applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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