Shenzhen, China

Qui Yi Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2017.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations by Qui Yi Zhang in Magnetic Resonance Imaging

Introduction

Qui Yi Zhang is an accomplished inventor based in Shenzhen, China. He has made significant contributions to the field of magnetic resonance imaging (MRI) technology. His innovative work has led to the development of a unique patent that enhances the functionality of MRI systems.

Latest Patents

Qui Yi Zhang holds a patent for a "Transmitting antenna level sensor of magnetic resonance imaging system and magnetic resonance imaging system." This invention includes a first detection channel for detecting the power of a first radio frequency signal source and a second detection channel for detecting the power of the same source. A control unit compares the two power levels to generate a comparison result, which triggers a notification message based on the findings. This advancement is crucial for improving the accuracy and efficiency of MRI systems. He has 1 patent to his name.

Career Highlights

Qui Yi Zhang is currently employed at Siemens Aktiengesellschaft, a leading global technology company. His role involves working on cutting-edge technologies that push the boundaries of medical imaging. His expertise in this area has made him a valuable asset to his team.

Collaborations

Qui Yi Zhang collaborates with his coworker, Lan Jin Wang, to further enhance their research and development efforts in MRI technology. Their combined expertise contributes to the innovative solutions being developed at Siemens.

Conclusion

Qui Yi Zhang's contributions to the field of magnetic resonance imaging exemplify the impact of innovation in medical technology. His patent reflects a commitment to advancing healthcare solutions through engineering and design.

Profile summary based on public USPTO records.
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